Method and system for performing components fault problem close loop analysis

ABSTRACT

A method and system for performing component fault problem close loop analysis are provided. The system establishes a component failure physics fault tree, converts the failure physics fault tree into a failure locating fault tree, establishes, a component fault dictionary with failure mechanism cause corresponding to failure characteristics and performs fault problem close loop analysis to the component according to the fault tree and the fault dictionary. By the method and system of the present disclosure, it is possible to locate the component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the component failure mode by analysis of failure feature vector of the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the failure physics fault tree. Thus, targeted failure control measures are proposed to achieve fast and accurate locating and diagnosis to the electronic component failure.

FIELD OF THE INVENTION

The present disclosure relates generally to the field of faultdiagnosis, and more particularly to a method and system for performingcomponent fault problem close loop analysis.

BACKGROUND OF THE INVENTION

The aim of component fault problem close loop analysis is to locatefailure and determine the failure mechanism by FTA and failure analysis,to propose improvements according to the cause of failure, and thus toachieve the fault problem close loop, that is, meeting the requirementsof “accurate locating, clear mechanism, and effective measures” to thefault. To achieve component fault problem close loop, a variety oftechniques are used. However, most of the existing techniques ofcomponent failure analysis are those of failure phenomenon observation,which lack of analysis technology to the failure information, and theresulted fault problem close loop conclusion are related to one'sanalysis experience. Thus, the key to fault problem close loop analysislies in the following aspects: performing fault problem close loopanalysis by systematically applying the failure observations and failureinformation, accurately giving the failure site and failure path insidea component, clearly giving the mechanism cause leading to the failure,and proposing effective measures for improving the mechanism reasons.

Fault tree analysis is a logical reasoning method for analysis of systemreliability and security. By analyzing and determining the logicalrelations from a variety of possible factors that may lead to failure,the causes of system failure can be identified using this method, whichhas been widely used in the field of aerospace and electronics systems,etc. In order to meet the quality problem close loop requirements,starting from the beginning of this century, fault tree analysis isgradually applied to electronic components to conduct fault problemclose loop analysis by learning the electronic fault tree analysis. Thecurrent problem to be solved is how to establish the component faulttree. In this regard, the fault dictionary method is an effective way toachieve fast fault location in complex electronic machines. The faultdictionary created should be able to reflect the relationship betweenthe cause of the fault of the measured object and the measurableexternal parameters and characteristics. The event information of faulttree is usually used to establish this type of relationship.

Fault diagnosis and fault problem close loop analysis using fault treeand fault dictionary method have the above advantages. Thus, for ageneral electronic machine, the fault tree and fault dictionary methodare usually used to perform fault diagnosis and locating. But forelectronic components, the general fault diagnosis and fault problemclose loop analysis using fault tree and fault dictionary method cannotaccurately perform fault locating and diagnosis due to the diversity ofthe failure modes and the complexity of the failure mechanism ofelectronic components.

SUMMARY OF THE INVENTION

To address the aforementioned deficiencies and inadequacies, there is aneed to provide a method and system for performing component faultproblem close loop analysis, which can perform fast and accuratelocating and diagnosis to electronic component failure.

According to an aspect of the present invention, a method for performingcomponent fault problem close loop analysis includes the steps of:

establishing, according to common characteristics of component failurephysics, a component failure physics fault tree;

converting a failure physics event into an observable node eventaccording to the failure physics fault tree, and converting the failurephysics fault tree into a failure locating fault tree;

establishing, according to the failure locating fault tree, a componentfault dictionary with failure mechanism cause corresponding to failurecharacteristics;

performing fault problem close loop analysis to the component accordingto the failure physics fault tree and the component fault dictionary.

In one embodiment, the common characteristics of component failurephysics include: fault object, failure mode, failure site, failuremechanism, mechanism factor, and influencing factor.

In one embodiment, the step of converting the failure physics fault treeinto a failure locating fault tree further includes:

determining an observable node between a failure mode and a failuremechanism, and representing an immeasurable event of failure physics byan observable node event;

selecting, according to the structure and performance characteristics ofthe component, feature parameters representing each node, the featureparameters being observable parameters, the observable parametersincluding: electrical properties, thermal properties, mechanicalproperties, the apparent characteristic, gas confidentiality, andenvironmental adaptability;

representing a component failure event by a node failure event, andrepresenting the node failure event by the observable parameters; and

establishing a component failure locating fault tree, the fault treehaving the failure mode as top event, the observable node asintermediate event, and the failure mechanism as bottom event.

In one embodiment, the step of establishing, according to the failurelocating fault tree, a component fault dictionary with failure mechanismcause corresponding to failure characteristics further includes:

determining, according to the failure positioning fault tree, acomponent failure mode set, the set including multiple subsets offailure mode;

determining, according to the failure positioning fault tree, observablenode of the subset of failure mode in a failure mode;

obtaining, according to the failure positioning fault tree, observedparameters from the observable node, and obtaining feature value of theobservable node in the failure mode according to the observedparameters;

determining, according to the feature value of the observable node,feature vector of the component in all failure modes;

determining, according to the failure positioning fault tree, failuremechanism cause of the component; and establishing, according to thefailure mechanism cause and the feature value of the observable node, acomponent fault dictionary with failure mechanism cause corresponding tofailure characteristics.

In one embodiment, the step of performing fault problem close loopanalysis to the component according to the failure physics fault treeand the component fault dictionary further includes:

observing the component according to the node parameters of thecomponent fault dictionary, and obtaining feature value of an observedvector;

comparing the feature value of the observed vector and the componentfault dictionary, and determining the failure mechanism cause of thecomponent;

looking for, according to the failure mechanism cause, the mechanismfactors and influencing factors corresponding to the failure mechanismin the failure physics fault tree, so as to propose measures against thefailure mechanism.

According to another aspect of the present invention, a system forperforming component fault problem close loop analysis includes:

a failure physics fault tree establishing module, configured toestablish, according to common characteristics of component failurephysics, a component failure physics fault tree;

a failure locating fault tree establishing module, configured to converta failure physics event into an observable node event according to thefailure physics fault tree, and to convert the failure physics faulttree into a failure locating fault tree;

a fault dictionary establishing module, configured to establish,according to the failure locating fault tree, a component faultdictionary with failure mechanism cause corresponding to failurecharacteristics;

a fault problem close loop analyzing module, configured to perform faultproblem close loop analysis to the component according to the failurephysics fault tree and the component fault dictionary.

In one embodiment, the common characteristics of component failurephysics include: fault object, failure mode, failure site, failuremechanism, mechanism factor, and influencing factor.

In one embodiment, the failure locating fault tree establishing modulefurther includes:

an event conversion unit, configured to determine an observable nodebetween a failure mode and a failure mechanism, and to represent animmeasurable event of failure physics by an observable node event;

a feature parameters selecting unit, configured to select, according tothe structure and performance characteristics of the component, featureparameters representing each node, the feature parameters beingobservable parameters, the observable parameters including: electricalproperties, thermal properties, mechanical properties, the apparentcharacteristic, gas confidentiality, and environmental adaptability;

a parameter representing unit, configured to represent a componentfailure event by a node failure event, and to represent the node failureevent by the observable parameters; and

a fault tree establishing unit, configured to establish a componentfailure locating fault tree, the fault tree having the failure mode astop event, the observable node as intermediate event, and the failuremechanism as bottom event.

In one embodiment, the fault dictionary establishing module furtherincludes:

a failure mode set determining unit, configured to determine, accordingto the failure positioning fault tree, a component failure mode set, theset including multiple subsets of failure mode;

an observable node determining module, configured to determine,according to the failure positioning fault tree, observable node of thesubset of failure mode in a failure mode;

a feature value obtaining unit, configured to obtain, according to thefailure positioning fault tree, observed parameters from the observablenode, and to obtain feature value of the observable node in the failuremode according to the observed parameters;

a feature vector obtaining unit, configured to determine, according tothe feature value of the observable node, feature vector of thecomponent in all failure modes;

a failure mechanism determining unit, configured to determine, accordingto the failure positioning fault tree, the failure mechanism cause ofthe component;

a fault dictionary establishing unit, configured to establish, accordingto the failure mechanism cause and the feature value of the observablenode, a component fault dictionary with failure mechanism causecorresponding to failure characteristics.

In one embodiment, the fault problem close loop analyzing module furtherincludes:

an observing unit, configured to observe the component according to thenode parameters of the component fault dictionary, and to obtain featurevalue of an observed vector;

a comparing unit, configured to compare the feature value of theobserved vector and the component fault dictionary, and to determine thefailure mechanism cause of the component;

a look-up unit, configured to look for, according to the failuremechanism cause, the mechanism factors and influencing factorscorresponding to the failure mechanism in the failure physics faulttree, so as to propose measures against the failure mechanism.

By the method and system for performing component fault problem closeloop analysis of the present disclosure, it is possible to locate thecomponent fault in the internal physical structure by the failurelocating fault tree, to give a clear failure path, to quickly identifythe failure mechanism corresponding to the component failure mode byanalysis of failure feature vector of the fault dictionary, and todetermine the mechanism factors and influencing factors of relevantfailure mechanism by the failure physics fault tree. Thus, targetedfailure control measures are proposed to achieve fast and accuratelocating and diagnosis to the electronic component failure.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a flowchart showing a method for performing component faultproblem close loop analysis according to an embodiment of thedisclosure.

FIG. 2 is a detailed flowchart showing a method for performing componentfault problem close loop analysis according to an embodiment of thedisclosure.

FIG. 3 is a structural schematic diagram showing a system for performingcomponent fault problem close loop analysis according to an embodimentof the disclosure.

FIG. 4 is a detailed structural schematic diagram showing a system forperforming component fault problem close loop analysis according to anembodiment of the disclosure.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

In the following description of embodiments, reference is made to theaccompanying drawings which form a part hereof, and in which it is shownby way of illustration specific embodiments of the disclosure that canbe practiced. It is to be understood that other embodiments can be usedand structural changes can be made without departing from the scope ofthe disclosed embodiments.

The basic principle of the method and system for performing componentfault problem close loop analysis of the present disclosure lies inthat, due to the similarity in structure and process of each type ofcomponent, the component failure physics fault tree can be establishedin accordance with the common characteristics of failure physics of suchtype of component, and the physical events of the failure physics faulttree can be described by conversion of observable events. The observableevents can be represented by physical parameters such as electricalproperties, thermal properties, mechanical properties, the apparentcharacteristic, and gas confidentiality, etc. Consequently, faultdictionary with single failure mechanism cause corresponding to failurecharacteristics is established. If the collected failure feature vectoris the same as a row vector of the fault dictionary, then the mechanismcause of the failure mode is determined. Further, improvements areproposed directed to the mechanism factor and influencing factor, so asto perform fault problem close loop analysis with “accurate locating,clear mechanism, and effective measures”.

As shown in FIGS. 1 and 2, a method for constructing component faulttree based on failure physics includes the following steps.

Step S100: establishing, according to common characteristics ofcomponent failure physics, a component failure physics fault tree.

Due to the similarity in structure and process of each type ofcomponent, the component failure physics fault tree can be establishedin accordance with the common characteristics of failure physics of suchcomponent.

In one embodiment, the common characteristics of component include faultobject, failure mode, failure site, failure mechanism, mechanism factor,and influencing factor. Such six common characteristics can completelyand comprehensively cover the fault feature and failure cause of thecomponents. After finishing arranging the six common characteristics, acomponent failure physics fault tree can be established respectively insix layers of fault object, failure mode, failure site, failuremechanism, mechanism factor, and influencing factor.

In this failure physics fault tree, according to the relevance of thecomponent failure physics, the relevance of events between the upper andlower grades of fault object, failure mode, failure site, and failuremechanism is an “OR” gate. The structural function of the “OR” gate ofthe events between the upper and lower grades is

${{\Phi \left( \overset{\rightarrow}{X} \right)} = {\overset{n}{\bigcup\limits_{1}}x_{i}}},$

wherein Φ is the status of the event of upper grade, and x is the statusof the event of lower grade; if the event xi of lower grade happens,then the value will be 1, otherwise it will be 0. The structuralfunction describing the occurrence status Φ of the upper event can be

${{\Phi \left( \overset{\rightarrow}{X} \right)} = {1 - {\prod\limits_{1}^{n}\; \left( {1 - x_{i}} \right)}}},$

and if the event happens, then the value will be 1, otherwise it will be0. This structural function means that the event of the upper grade willhappen if only an event of lower grade happens. Meanwhile, the relevanceof events between the upper and lower grades of failure mechanism,mechanism factor and influencing factor is an “OR” gate or “AND” gate,wherein the structural function of the “AND” gate is

${{\Phi \left( \overset{\rightarrow}{X} \right)} = {\underset{1}{\bigcap\limits^{n}}x_{i}}},$

and if the event xi of lower grade happens, then the value will be 1,otherwise it will be 0. The structural function describing theoccurrence status Φ of the upper event is

${{\Phi \left( \overset{\rightarrow}{X} \right)} = {\prod\limits_{1}^{n}x_{i}}},$

and if the event happens, then the value will be 1, otherwise it will be0. This structural function means that the event of the upper grade willhappen only if all events of lower grade happen. Physical events of eachlayer from the second to the sixth layer of the fault tree can bedecomposed into events of 1 to 3 grades, forming component fault tree ofn grades and of six physical layers, and it is easy to understand thatthe minimum of n is 6.

Step S200: converting a failure physics event into an observable nodeevent according to the failure physics fault tree, and converting thefailure physics fault tree into a failure locating fault tree.

In one embodiment, Step S200 further includes:

Step S220: determining an observable node between a failure mode and afailure mechanism, and representing an immeasurable event of failurephysics by an observable node event;

Step S240: selecting, according to the structure and performancecharacteristics of the component, feature parameters representing eachnode, the feature parameters being observable parameters, the observableparameters including: electrical properties, thermal properties,mechanical properties, the apparent characteristic, gas confidentiality,and environmental adaptability;

Step S260: representing a component failure event by a node failureevent, and representing the node failure event by the observableparameters; and

Step S280: establishing a component failure locating fault tree, thefault tree having the failure mode as top event, the observable node asintermediate event, and the failure mechanism as bottom event.

Step S300: establishing, according to the failure locating fault tree, acomponent fault dictionary with failure mechanism cause corresponding tofailure characteristics.

In one embodiment, Step S300 further includes:

Step S310: determining, according to the failure positioning fault tree,a component failure mode set, the set including multiple subsets offailure mode;

Step S320: determining, according to the failure positioning fault tree,observable node of the subset of failure mode in a failure mode;

Step S330: obtaining, according to the failure positioning fault tree,observed parameters from the observable node, and obtaining featurevalue of the observable node in the failure mode according to theobserved parameters;

Step S340: determining, according to the feature value of the observablenode, feature vector of the component in all failure modes;

Step S350: determining, according to the failure positioning fault tree,failure mechanism cause of the component; and

Step S360: establishing, according to the failure mechanism cause andthe feature value of the observable node, a component fault dictionarywith failure mechanism cause corresponding to failure characteristics.

Step S400: performing fault problem close loop analysis to the componentaccording to the failure physics fault tree and the component faultdictionary.

In one embodiment, Step S400 further includes:

Step S420: observing the component according to the node parameters ofthe component fault dictionary, and obtaining feature value of anobserved vector;

Step S440: comparing the feature value of the observed vector and thecomponent fault dictionary, and determining the failure mechanism causeof the component; and

Step S460: looking for, according to the failure mechanism cause, themechanism factors and influencing factors corresponding to the failuremechanism in the failure physics fault tree, so as to propose measuresagainst the failure mechanism.

By the method for performing component fault problem close loop analysisof the present disclosure, it is possible to locate the component faultin the internal physical structure by the failure locating fault tree,to give a clear failure path, to quickly identify the failure mechanismcorresponding to the component failure mode by analysis of failurefeature vector of the fault dictionary, and to determine the mechanismfactors and influencing factors of relevant failure mechanism by thefailure physics fault tree. Thus, targeted failure control measures areproposed to achieve fast and accurate locating and diagnosis to theelectronic component failure.

To better illustrate the method for performing component fault problemclose loop analysis of the disclosure, an example of fault problem closeloop analysis of “electrical parameter drift” of hybrid integratedcircuit will be further described to illustrate the technical solutionand the beneficial effect brought.

Step 1, establishing a failure physics fault tree of hybrid integratedcircuit.

Establish a failure physics fault tree of a failure mode according tothe characteristics of “electrical parameter drift” failure physics ofhybrid integrated circuit.

Establish a failure physics fault tree of hybrid integrated circuit insix layers of fault object, failure mode, failure site, failuremechanism, mechanism factor, and influencing factor. In this faultobject, logical relation between events of the first, second, third andfourth layers are “OR” gate, and logical relation between events of thefourth, fifth and sixth layers are “AND” gate. The failure physics faulttree has sixth layers of failure physics and events of eight grades intotal.

Step 2, converting the failure physics fault tree into a failurelocating fault tree.

Convert the failure physics fault tree established in Step 1 into afailure locating fault tree having failure mechanism as the bottomevent.

Firstly, regarding the established failure physics fault tree of hybridintegrated circuit, between the failure object top events and thefailure mechanism events, converting the failure physics events thatcannot be measured directly including immeasurable degradation ofcomponent welding/soldering, and degradation of wire bonding point intoone or more measurable and observable node events including: thermalresistance of the component is too high, wire bonding strength fails toreach the standard, clear IMC on the interface, etc., which are theintermediate events of the failure locating fault tree.

The node failure events are represented by feature parameters includingjunction temperature Tj, bonding strength, the interface IMC, moisturecontent, etc.

The converted failure locating fault tree of “electrical parameterdrift” of hybrid integrated circuit is a failure locating fault treecontaining 15 failure mechanism causes and 8 grades of events.

Step 3, establishing a component fault dictionary of electricalparameter drift of hybrid integrated circuit.

Establish a component fault dictionary with single failure mechanismcause corresponding to failure characteristics according to the failurelocating fault tree established in Step 2.

Determine 23 observable nodes and their feature parameters in theelectrical parameter drift failure mode F₁. The node feature parametersrepresenting that internal component failure causes HIC parameters driftincludes: component parameter drift, component microcrack, ESD damage,and surface contamination and leakage, etc. The node feature parametersrepresenting that assembly failure causes HIC parameter drift includes:component welding/soldering thermal resistance, bonding interface IMCand bonding point corrosion, etc. The node feature parametersrepresenting that insulation degradation causes HIC parameter driftincludes: insulation resistance between pin/housing, and insulationresistance between joints, etc. The node failure feature parameter isX₁={X_(1,1), X_(1,2), . . . , X_(1,23)}.

Based on the node failure feature parameter of X₁={X_(1,1), X_(1,2), . .. , X_(1,23)}, the corresponding feature value F_(1,j) is obtained bythe following equation according to the range of X₁, so as to obtain thefeature vector, F_(i,1)={F_(1,1), F_(1,2), . . . , F_(1,23)}. The rangeof sp refers to the qualified criteria of relevant standards of hybridintegrated circuit and the components, namely the observed range of eachnode.

$F_{i,j} = \left\{ \begin{matrix}1 & {X_{i,j} \notin {sp}} \\0 & {X_{i,j} \in {sp}}\end{matrix} \right.$

There are 15 failure mechanism causes for electrical parameter drift ofhybrid integrated circuit, and mechanism cause set is M_(1,j)={M_(1,1),M_(1,2), . . . , M_(i,15)}. According to the logical relationshipbetween the node events of the failure locating fault tree of electricalparameter drift, corresponding relationships between each observed nodefailure feature and failure mechanism cause are given in the followinglist.

A fault code dictionary of the electrical parameter drift mode of hybridintegrated circuit is established based on the correspondingrelationships between each observed node failure feature and failuremechanism cause. See Table 1: Failure code fault dictionary of HIC“electrical parameter drift”.

FIG. 1 mechanism Failure Feature cause F_(1, 1) F_(1, 2) F_(1, 3)F_(1, 4) F_(1, 5) F_(1, 6) F_(1, 7) F_(1, 8) F_(1, 9) F_(1, 10)F_(1, 11) F_(1, 12) M_(1, 1) 1 1 1 0 0 0 0 0 0 0 0 0 M_(1, 2) 1 1 0 1 00 0 0 0 0 0 0 M_(1, 3) 1 1 0 0 1 0 0 0 0 0 0 0 M_(1, 4) 1 1 0 0 0 1 0 00 0 1 0 M_(1, 5) 1 1 0 0 0 1 0 0 0 0 0 1 M_(1, 6) 1 1 0 0 0 0 1 0 0 0 00 M_(1, 7) 1 1 0 0 0 0 1 0 0 0 0 0 M_(1, 8) 1 1 0 0 0 0 1 0 0 0 0 0M_(1, 9) 1 1 0 0 0 0 1 0 0 0 0 0 M_(1, 10) 1 1 0 0 0 0 0 0 0 0 0 0M_(1, 11) 1 1 0 0 0 0 0 0 0 0 0 0 M_(1, 12) 1 1 0 0 0 0 0 0 0 0 0 0M_(1, 13) 1 1 0 0 0 0 0 1 0 0 0 0 M_(1, 14) 1 1 0 0 0 0 0 0 1 0 0 0M_(1, 15) 1 1 0 0 0 0 0 0 0 1 0 0 mechanism Failure Feature causeF_(1, 13) F_(1, 14) F_(1, 15) F_(1, 16) F_(1, 17) F_(1, 18) F_(1, 19)F_(1, 20) F_(1, 21) F_(1, 22) F_(1, 23) M_(1, 1) 0 0 0 0 0 0 0 0 0 0 0M_(1, 2) 0 0 0 0 0 0 0 0 0 0 0 M_(1, 3) 0 0 0 0 0 0 0 0 0 0 0 M_(1, 4) 00 0 0 0 0 0 0 0 0 0 M_(1, 5) 0 0 0 0 0 0 0 0 0 0 0 M_(1, 6) 1 0 0 0 0 00 0 0 0 0 M_(1, 7) 0 1 0 0 0 0 0 0 0 0 0 M_(1, 8) 0 0 1 0 0 0 0 0 0 1 0M_(1, 9) 0 0 0 1 0 0 0 0 0 1 0 M_(1, 10) 0 0 0 0 1 0 0 0 0 0 1 M_(1, 11)0 0 0 0 0 1 0 0 0 0 1 M_(1, 12) 0 0 0 0 0 1 0 0 0 0 1 M_(1, 13) 0 0 0 00 0 1 0 0 0 0 M_(1, 14) 0 0 0 0 0 0 0 1 0 0 0 M_(1, 15) 0 0 0 0 0 0 0 01 0 0

Step 4, performing fault problem close loop analysis to the electricalparameter drift according to the fault tree and fault dictionary.

Perform fault problem close loop analysis to the electrical parameterdrift of hybrid integrated circuit according to the fault dictionaryestablished in Step 3 and the failure physics fault tree established inStep 1.

According to the node parameters of the fault dictionary, the hybridintegrated circuit is observed, and the feature value of the measuredobservation vector F_(i,1)={F_(1,1), F_(1,2), . . . , F_(1,23)} iscompared with the fault dictionary. If the feature value is the same toa row vector of the fault dictionary, then it can be determined that afailure of corresponding single mechanism (M_(i,j)) cause has happenedto the component. After determining the failure mechanism cause, themechanism factors and influencing factors of corresponding failuremechanism (M_(i,j)) is looked up in the failure physics fault tree, soas to propose control measures to the failure mechanism.

A fault problem close loop analysis is conducted by applying the abovefault tree of electrical parameter drift of hybrid integrated circuitand the fault dictionary.

After a high temperature steady life test, the output voltage of alinear power hybrid integrated circuit is out of tolerance. Thus, thefault tree and fault dictionary method is used to conduct fault problemclose loop analysis to the circuit to find the failure mechanism causeand determine the failure path, so as to propose control measures.

Upon analysis and observation of the circuit, the feature value of themeasured observation vector F_(i,1)={F_(1,1), F_(1,2), . . . , F_(1,23)}is compared with the fault dictionary of electrical parameter driftfailure of Table 1. Considering that the vector result of the featureparameter of a chip is the same to the vector of mechanism M_(1,1) ofthe first row, the failure mechanism M_(1,1) is determined as:electrical parameter drift caused by component degradation or overloadusage is the cause of out-of-tolerance output voltage. Based on thefailure physics fault tree, and considering the high test temperatureheat and the allowable junction temperature limit T_(Mj) of the chip, itis determined that the out-of-tolerance output voltage is caused by theelectrical parameter drift of the chip due to overrun use of chipjunction temperature. Therefore, the failure control measures are toselect a chip with higher level of junction temperature limit T_(Mj),and to design and use it in a thermal derating way.

As shown in FIG. 3, a system for performing component failure faultproblem close loop analysis includes:

a failure physics fault tree establishing module 100, configured toestablish, according to common characteristics of component failurephysics, a component failure physics fault tree;

a failure locating fault tree establishing module 200, configured toconvert a failure physics event into an observable node event accordingto the failure physics fault tree, and to convert the failure physicsfault tree into a failure locating fault tree;

a fault dictionary establishing module 300, configured to establish,according to the failure locating fault tree, a component faultdictionary with failure mechanism cause corresponding to failurecharacteristics; and

a failure fault problem close loop analyzing module 400, configured toperform fault problem close loop analysis to the component according tothe failure physics fault tree and the component fault dictionary.

By the system for performing component fault problem close loop analysisof the present disclosure, it is possible to locate the component faultin the internal physical structure by the failure locating fault tree,to give a clear failure path, to quickly identify the failure mechanismcorresponding to the component failure mode by analysis of failurefeature vector of the fault dictionary, and to determine the mechanismfactors and influencing factors of relevant failure mechanism by thefailure physics fault tree. Thus, targeted failure control measures areproposed to achieve fast and accurate locating and diagnosis to theelectronic component failure.

In one embodiment, the common characteristics of component failurephysics include: fault object, failure mode, failure site, failuremechanism, mechanism factor, and influencing factor.

Thus, using the six common characteristics, it is possible to completelyand comprehensively conduct fault diagnosis and locating of thecomponent. After finishing arranging the six common characteristics, acomponent failure physics fault tree can be established respectively insix layers of fault object, failure mode, failure site, failuremechanism, mechanism factor, and influencing factor.

As shown in FIG. 4, the failure locating fault tree establishing module200 further includes:

an event conversion unit 220, configured to determine an observable nodebetween a failure mode and a failure mechanism, and to represent animmeasurable event of failure physics by an observable node event;

a feature parameters selecting unit 240, configured to select, accordingto the structure and performance characteristics of the component,feature parameters representing each node, the feature parameters beingobservable parameters, the observable parameters including: electricalproperties, thermal properties, mechanical properties, the apparentcharacteristic, gas confidentiality, and environmental adaptability;

a parameter representing unit 260, configured to represent a componentfailure event by a node failure event, and to represent the node failureevent by the observable parameters; and a fault tree establishing unit280, configured to establish a component failure locating fault tree,the fault tree having the failure mode as top event, the observable nodeas intermediate event, and the failure mechanism as bottom event.

As shown in FIG. 4, the fault dictionary establishing module 300 furtherincludes:

a failure mode set determining unit 310, configured to determine,according to the failure positioning fault tree, a component failuremode set, the set including multiple subsets of failure mode;

an observable node determining module 320, configured to determine,according to the failure positioning fault tree, observable node of thesubset of failure mode in a failure mode;

a feature value obtaining unit 330, configured to obtain, according tothe failure positioning fault tree, observed parameters from theobservable node, and to obtain feature value of the observable node inthe failure mode according to the observed parameters;

a feature vector obtaining unit 340, configured to determine, accordingto the feature value of the observable node, feature vector of thecomponent in all failure modes;

a failure mechanism determining unit 350, configured to determine,according to the failure positioning fault tree, the failure mechanismcause of the component; and

a fault dictionary establishing unit 360, configured to establish,according to the failure mechanism cause and the feature value of theobservable node, a component fault dictionary with failure mechanismcause corresponding to failure characteristics.

As shown in FIG. 4, the fault problem close loop analyzing module 400further includes:

an observing unit 420, configured to observe the component according tothe node parameters of the component fault dictionary, and to obtainfeature value of an observed vector;

a comparing unit 440, configured to compare the feature value of theobserved vector and the component fault dictionary, and to determine thefailure mechanism cause of the component; and

a look-up unit 460, configured to look for, according to the failuremechanism cause, the mechanism factors and influencing factorscorresponding to the failure mechanism in the failure physics faulttree, so as to propose measures against the failure mechanism.

Based on the above, by the method and system for performing componentfault problem close loop analysis of the present disclosure, it ispossible to locate the component fault in the internal physicalstructure by the failure locating fault tree, to give a clear failurepath, to quickly identify the failure mechanism corresponding to thecomponent failure mode by analysis of failure feature vector of thefault dictionary, and to determine the mechanism factors and influencingfactors of relevant failure mechanism by the failure physics fault tree.Thus, targeted failure control measures can be proposed to achieve fastand accurate locating and diagnosis to the electronic component failure,meeting the requirements of “accurate locating, clear mechanism, andeffective measures”.

The embodiments are chosen and described in order to explain theprinciples of the disclosure and their practical application so as toallow others skilled in the art to utilize the disclosure and variousembodiments and with various modifications as are suited to theparticular use contemplated. Alternative embodiments will becomeapparent to those skilled in the art to which the present disclosurepertains without departing from its spirit and scope. Accordingly, thescope of the present disclosure is defined by the appended claims ratherthan the foregoing description and the exemplary embodiments describedtherein.

1. A method for performing component fault problem close loop analysis,comprising: establishing, according to common characteristics ofcomponent failure physics, a component failure physics fault tree;converting a failure physics event into an observable node eventaccording to the failure physics fault tree, and converting the failurephysics fault tree into a failure locating fault tree; establishing,according to the failure locating fault tree, a component faultdictionary with failure mechanism cause corresponding to failurecharacteristics; and performing fault problem close loop analysis to thecomponent according to the failure physics fault tree and the componentfault dictionary.
 2. The method of claim 1, wherein the commoncharacteristics of component failure physics comprise: fault object,failure mode, failure site, failure mechanism, mechanism factor, andinfluencing factor.
 3. The method of claim 1, wherein the step ofconverting the failure physics fault tree into a failure locating faulttree further comprises: determining an observable node between a failuremode and a failure mechanism, and representing an immeasurable event offailure physics by an observable node event; selecting, according to thestructure and performance characteristics of the component, featureparameters representing each node, the feature parameters beingobservable parameters, the observable parameters including: electricalproperties, thermal properties, mechanical properties, the apparentcharacteristic, gas confidentiality, and environmental adaptability;representing a component failure event by a node failure event, andrepresenting the node failure event by the observable parameters; andestablishing a component failure locating fault tree, the fault treehaving the failure mode as top event, the observable node asintermediate event, and the failure mechanism as bottom event.
 4. Themethod of claim 1, wherein the step of establishing, according to thefailure locating fault tree, a component fault dictionary with failuremechanism cause corresponding to failure characteristics furthercomprises: determining, according to the failure positioning fault tree,a component failure mode set, the set including multiple subsets offailure mode; determining, according to the failure positioning faulttree, observable node of the subset of failure mode in a failure mode;obtaining, according to the failure positioning fault tree, observedparameters from the observable node, and obtaining feature value of theobservable node in the failure mode according to the observedparameters; determining, according to the feature value of theobservable node, feature vector of the component in all failure modes;determining, according to the failure positioning fault tree, failuremechanism cause of the component; and establishing, according to thefailure mechanism cause and the feature value of the observable node, acomponent fault dictionary with failure mechanism cause corresponding tofailure characteristics.
 5. The method of claim 1, wherein the step ofperforming fault problem close loop analysis to the component accordingto the failure physics fault tree and the component fault dictionaryfurther comprises: observing the component according to the nodeparameters of the component fault dictionary, and obtaining featurevalue of an observed vector; comparing the feature value of the observedvector and the component fault dictionary, and determining the failuremechanism cause of the component; looking for, according to the failuremechanism cause, the mechanism factors and influencing factorscorresponding to the failure mechanism in the failure physics faulttree, so as to propose measures against the failure mechanism.
 6. Asystem for performing component fault problem close loop analysis,comprising: a failure physics fault tree establishing module, configuredto establish, according to common characteristics of component failurephysics, a component failure physics fault tree; a failure locatingfault tree establishing module, configured to convert a failure physicsevent into an observable node event according to the failure physicsfault tree, and to convert the failure physics fault tree into a failurelocating fault tree; a fault dictionary establishing module, configuredto establish, according to the failure locating fault tree, a componentfault dictionary with failure mechanism cause corresponding to failurecharacteristics; and a fault problem close loop analyzing module,configured to perform fault problem close loop analysis to the componentaccording to the failure physics fault tree and the component faultdictionary.
 7. The system of claim 6, wherein the common characteristicsof component failure physics comprise: fault object, failure mode,failure site, failure mechanism, mechanism factor, and influencingfactor.
 8. The system of claim 6, wherein the failure locating faulttree establishing module further comprises: an event conversion unit,configured to determine an observable node between a failure mode and afailure mechanism, and to represent an immeasurable event of failurephysics by an observable node event; a feature parameters selectingunit, configured to select, according to the structure and performancecharacteristics of the component, feature parameters representing eachnode, the feature parameters being observable parameters, the observableparameters including: electrical properties, thermal properties,mechanical properties, the apparent characteristic, gas confidentiality,and environmental adaptability; a parameter representing unit,configured to represent a component failure event by a node failureevent, and to represent the node failure event by the observableparameters; and a fault tree establishing unit, configured to establisha component failure locating fault tree, the fault tree having thefailure mode as top event, the observable node as intermediate event,and the failure mechanism as bottom event.
 9. The system of claim 6,wherein the fault dictionary establishing module further comprises: afailure mode set determining unit, configured to determine, according tothe failure positioning fault tree, a component failure mode set, theset including multiple subsets of failure mode; an observable nodedetermining module, configured to determine, according to the failurepositioning fault tree, observable node of the subset of failure mode ina failure mode; a feature value obtaining unit, configured to obtain,according to the failure positioning fault tree, observed parametersfrom the observable node, and to obtain feature value of the observablenode in the failure mode according to the observed parameters; a featurevector obtaining unit, configured to determine, according to the featurevalue of the observable node, feature vector of the component in allfailure modes; a failure mechanism determining unit, configured todetermine, according to the failure positioning fault tree, the failuremechanism cause of the component; and a fault dictionary establishingunit, configured to establish, according to the failure mechanism causeand the feature value of the observable node, a component faultdictionary with failure mechanism cause corresponding to failurecharacteristics.
 10. The system of claim 6, wherein the fault problemclose loop analyzing module further comprises: an observing unit,configured to observe the component according to the node parameters ofthe component fault dictionary, and to obtain feature value of anobserved vector; a comparing unit, configured to compare the featurevalue of the observed vector and the component fault dictionary, and todetermine the failure mechanism cause of the component; a look-up unit,configured to look for, according to the failure mechanism cause, themechanism factors and influencing factors corresponding to the failuremechanism in the failure physics fault tree, so as to propose measuresagainst the failure mechanism.